Multilayer X-ray diffraction 27Aldp 6855Jk Sputtering Oxygen deficiency Channeling Aluminium PIXE EPR Measurement Nickel HfO2 Ageing Epitaxy XPS 3C-SiC AFM SiC AC susceptibility Ion implantation Hysteresis XRD Metal-insulator transition Pb centers GaMnAs 27Alda RBS Pulsed laser deposition Ferromagnetic resonance 15N Photoluminescence NRP Transparent conductive oxide TCO Adsorption Oxidation 8140Ef Low energy electron diffraction LEED Periodic multilayer Rutherford backscattering spectrometry RBS Gallium oxide Silicon Carbide ADSORPTION DESORPTION HYSTERESIS 2H 27Ald p&α Ion beam analysis Adsorbed layers NRA Nuclear reaction analysis Diffusion Defects Nitridation 13C Silicon carbide Magnetization curves Annealing Nanostructures Zinc oxide Epitaxial growth Stable isotopic tracing Aluminum Thin film Acoustic 7630Lh Atomic Layer Deposition ALD Acoustic propreties of solid Raman spectroscopy Charge exchange Capillary condensation Indium oxide Isotopic Tracing 18O resonance 7550Ee Interface defects 17Opp Density functional theory Nuclear resonance profiling NRP Growth ALD 17Op Al2O3 Magnetic semiconductors Auger electron spectroscopy AES Kossel diffraction Thin films Evaluation 17O Nanoparticles Topological insulators 18O Magnetic anisotropy Silicon Passivation Topological defects Energy loss Silica Gold Adsorption Isotherms Alloys 7550Pp