The shift towards data-centric computing paradigms has given rise to new architectural approaches aimed at minimizing data movement and enhancing computational efficiency. In this context, In-Memory Computing (IMC) architectures have gained prominence for their ability to perform processing tasks within the memory array, reducing the recourse to data transfers. However, the susceptibility of these new paradigms to manufacturing defects poses a critical test challenge. This paper presents a novel March-like test algorithm for 8T SRAM-based IMC architectures, addressing the imperative need for comprehensive read port related defect coverage. The proposed algorithm achieves complete coverage of potential read port defects while maintaining the level of complexity equivalent to existing state-of-the-art test solutions.